Scanning Electron Microscope (SEM)  

JEOL Scanning Electron Microscope (SEM)

JEOL has played a leading role in the development and evolution of scanning electron microscopes since the early 1960s. JEOL provides valuable applications support, comprehensive training, and award-winning service for the long lifetime of our instruments.

JEOL innovations in resolution and functionality enable the microscopist to better image and characterize a new generation of nanomaterials, capture biological details, analyze forensic evidence in detail, direct write fine nanopatterns, and pinpoint elusive quality problems.

 
  ----JCM-6000Plus    
  ----JSM-IT100    
  ----JSM-IT500    
  ----JSM-IT500HR    
  ----JSM-7610FPlus