Ultimate spatial resolution and low energy performance for EDS in the SEM. Combining Extreme electronics and windowless construction with optimised geometry and sensor design delivers up to 15x greater sensitivity than a conventional large area SDD.
> Biological specimen analysis at low KV with light element sensitivity
> Detection and mapping of Li X-rays
> Work at energies of less than 2kV to deliver sub 10nm spatial resolution in bulk samples
> Materials characterisation at sub 1kV
> Combine with immersion optics to collect high sensitivity data at up to 30kV with no compromise
The Ultim Extreme is a windowless 100 mm2 version of Ultim designed to maximise sensitivity and spatial resolution. It uses a radical geometry to optimise both imaging and EDS performance in ultra-high resolution FEG-SEMs while working at low kV and short working distance. With Ultim Extreme, EDS resolution approaches that of the SEM.