JEM-1400Flash

Transmission Electron Microscope

The JEOL JEM-1400 series 120kV Transmission Electron Microscope is widely accepted for its ease of use and high resolution imaging and analysis. Applications include pathology, biology, quality control, nanotechnology, polymer, and materials development.

Introduced in 2017 and derived from the highly successful JEM-1400(Plus), the JEM-1400Flash makes it easier for the user to first view samples at low magnification before studying the fine structures of interest at high magnification. To smoothly transition from low to high magnification and acquire higher-throughput image data, the JEM-1400Flash has an integrated high-sensitivity sCMOS camera, an ultra-wide area montage system, and an OM (optical microscope) image linkage function. To increase the throughput, the JEM-1400Flash is equipped with a TMP, which besides resulting in an oil-free column vacuum, also allows for instantaneous sample exchanges.

The JEM-1400Flash features high resolution/high contrast imaging, outstanding S/TEM analytical performance, elemental mapping with the latest large-area SDD detectors, cryomicroscopy, 3D tomography, and montaging. A compact, easy-to-use TEM, it supports optional STEM digital imaging/scanning circuitry with STEM images (BF/DF) on the standard GUI.